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The work we do is focused on the fabrication, imaging, and characterization of nanoscale devices. Please click on the thumbnail below for a photo gallery and detailed description of the specific equipment.
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The XE-100 is a versatile system that is a combined Atomic Force Microscope (AFM), Scanning Probe Microscope (SPM) and Scanning Tunneling Microscope (STM) that provides atomic resolution imaging of nanostructures. The XE-100 provides true non-contact mode thus achieving an unprecedented tip-sample distance, combined with superb tip and sample preservation; the advantages of true non-contact mode enable the ultimate resolution of AFM and measurement accuracy. The key innovation that enables True Non-Contact Mode is the ultra high force z-scanner that allows a significantly higher resonance frequency than those of conventional piezoelectric tube scanners. In addition, no coupling between the x-y plane and the z-scanner completely removes background curvature from the fundamental level, and effectively eliminates the cross-talk and non-linearity problems that are intrinsic to conventional piezoelectric tube based AFM systems.
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© 2007 Nevada Nanotechnology Center • University of Nevada, Las Vegas
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