|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
The work we do is focused on the fabrication, imaging, and characterization of nanoscale devices. Please click on the thumbnail below for a photo gallery and detailed description of the specific equipment.
 |
 |
 |
 |
 |
 |
 |
 |
Veeco Dektak 6M Stylus Profiler
Dektak 6M profilometer incorporates Low-Inertia Sensor 3 head to provide step height, surface roughness, and waviness measurements on a wide variety of surfaces. it measures step heights on any surface with programmable stylus force down to 1 mg and Z-height capability to 1 mm. It also delivers horizontal resolution with up to 30,000 data points per scan. The instrument has vertical resolution in nanometers and horizontal resolution as small as about twenty nanometers.
Home 
News Research Publications Facility People Courses Chat Links Outreach Contact Us
UNLV Home Engineering Home Electrical & Computer Engineering
© 2007 Nevada Nanotechnology Center • University of Nevada, Las Vegas
 |
|
 |
|
 |
|
